Copyright © Philip M. Parker, INSEAD. Terms of Use.
| Domain | Definition |
Occupations | Tests semiconductor wafer substrate, using testing equipment, such as probe tester, spectophotometer, and curve tracer, to evaluate electrical characteristics of wafer substrate: Places wafer, using tweezers, on test equipment that measures electrical characteristics of wafer substrate, such as resistivity, capacitance, and voltage. Starts equipment and observes equipment readout to determine wafer electrical measurements. Records measurements in production log. Compares measurements with specification sheets to determine if wafer substrate meets company standards. Sorts, boxes, and labels tested wafers. Delivers wafers and process sheets to production line workers. Maintains production records. May inspect wafer substrate surfaces, using ultraviolet lamp, to detect scratches and contamination. (references) |
Source: compiled by the editor from various references; see credits. | |
Hexadecimal (or equivalents, 770AD-1900s) (references)54 45 53 54 45 52 2C 57 41 46 45 52 53 55 42 53 54 52 41 54 45 |
| Leonardo da Vinci (1452-1519; backwards) (references)
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Binary Code (1918-1938, probably earlier) (references)01010100 01000101 01010011 01010100 01000101 01010010 00101100 00100000 01010111 01000001 01000110 01000101 01010010 00100000 01010011 01010101 01000010 01010011 01010100 01010010 01000001 01010100 01000101 |
HTML Code (1990) (references)T E S T E R ,   W A F E R   S U B S T R A T E |
ISO 10646 (1991-1993) (references)0054 0045 0053 0054 0045 0052 002C 0057 0041 0046 0045 0052 0053 0055 0042 0053 0054 0052 0041 0054 0045 |
Encryption (beginner's substitution cypher): (references)54395354395214257354039522535536535452355439 |
| 1. Orthography 2. Bibliography |
Copyright © Philip M. Parker, INSEAD. Terms of Use.
