Copyright © Philip M. Parker, INSEAD. Terms of Use.
| Domain | Definition |
Occupations | Inspects integrated circuit (IC) assemblies, semiconductor wafers, and IC $T3dies$T1 for conformance to company standards, using microscope: Reads work order to determine inspection criteria. Places group of items in trays on microscope stage, or positions items individually on stage for inspection, using vacuum pencil or tweezers. Turns knobs on microscope to adjust focus and magnification as required to view items for inspection. Views and inspects items according to company standards to detect defects, such as broken circuit lines, bridged circuits, misalignments, symbol errors, and missing solder. Discards defective items. May remove contaminants from items, using brush or airhose. May use magnifying glass to inspect electronic items. (references) |
Source: compiled by the editor from various references; see credits. | |
Hexadecimal (or equivalents, 770AD-1900s) (references)49 4E 53 50 45 43 54 4F 52 2C 49 4E 54 45 47 52 41 54 45 44 43 49 52 43 55 49 54 53 |
| Leonardo da Vinci (1452-1519; backwards) (references)
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Binary Code (1918-1938, probably earlier) (references)01001001 01001110 01010011 01010000 01000101 01000011 01010100 01001111 01010010 00101100 00100000 01001001 01001110 01010100 01000101 01000111 01010010 01000001 01010100 01000101 01000100 00100000 01000011 01001001 01010010 01000011 01010101 01001001 01010100 01010011 |
HTML Code (1990) (references)I N S P E C T O R ,   I N T E G R A T E D   C I R C U I T S |
ISO 10646 (1991-1993) (references)0049 004E 0053 0050 0045 0043 0054 004F 0052 002C 0049 004E 0054 0045 0047 0052 0041 0054 0045 0044 0043 0049 0052 0043 0055 0049 0054 0053 |
Encryption (beginner's substitution cypher): (references)4348535039375449521424348543941523554393823743523755435453 |
| 1. Orthography 2. Bibliography |
Copyright © Philip M. Parker, INSEAD. Terms of Use.
