Copyright © Philip M. Parker, INSEAD. Terms of Use.

| Domain | Definition |
Electrical Engineering | Defects, such as dangling bonds, induced in an amorphous silicon semiconductor upon initial exposure to light. Source: European Union. (references) |
Source: compiled by the editor from various references; see credits. | |
| Language | Translations for "LIGHT-INDUCED DEFECTS"; alternative meanings/domain in parentheses. | ||||||||||||||||
Danish | lysinducerede fejl. (various references) | ||||||||||||||||
Dutch | defect door blootstelling aan licht. (various references) | ||||||||||||||||
Finnish | valon aiheuttamat vauriot. (various references) | ||||||||||||||||
German | strahlungsinduzierte Defekte. (various references) | ||||||||||||||||
Greek | φωτογενή ελαττώματα. (various references) | ||||||||||||||||
Pig Latin | ight-inducedlay efectsday defectos inducidos por la luz. (various references) ljusinducerade fel. (various references) | ||||||||||||||||
Copyright © Philip M. Parker, INSEAD. Terms of Use.