Copyright © Philip M. Parker, INSEAD. Terms of Use.
| Domain | Definition |
Occupations | Performs any of following duties to inspect, measure, and test semiconductor wafers for conformance to specifications: Inspects wafers under high intensity lamp to detect surface defects, such as scratches, chips, stains, burns, or haze. Measures thickness and resistivity of wafers, using electronic gauges or automated sorting machine. Measures diameter and $T3flat$T1 of wafers, using calipers. Inspects bow or flatness of wafers, using electronic gauges, or examines surface of wafers under high intensity lamp. Tests for positive or negative conductivity of wafers, using electronic probe and gauge. Determines $T3crystal orientation$T1 of wafers, using x-ray equipment. Encloses containers of inspected wafers in plastic bags for protection, using heat sealer. Records inspection data on production records or in computer, using computer terminal. May tend equipment that cleans surface of wafers [WAFER CLEANER (electron. comp.) 590.685-102]. (references) |
Source: compiled by the editor from various references; see credits. | |
Hexadecimal (or equivalents, 770AD-1900s) (references)49 4E 53 50 45 43 54 4F 52 2C 53 45 4D 49 43 4F 4E 44 55 43 54 4F 52 57 41 46 45 52 |
| Leonardo da Vinci (1452-1519; backwards) (references)
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Binary Code (1918-1938, probably earlier) (references)01001001 01001110 01010011 01010000 01000101 01000011 01010100 01001111 01010010 00101100 00100000 01010011 01000101 01001101 01001001 01000011 01001111 01001110 01000100 01010101 01000011 01010100 01001111 01010010 00100000 01010111 01000001 01000110 01000101 01010010 |
HTML Code (1990) (references)I N S P E C T O R ,   S E M I C O N D U C T O R   W A F E R |
ISO 10646 (1991-1993) (references)0049 004E 0053 0050 0045 0043 0054 004F 0052 002C 0053 0045 004D 0049 0043 004F 004E 0044 0055 0043 0054 004F 0052 0057 0041 0046 0045 0052 |
Encryption (beginner's substitution cypher): (references)4348535039375449521425339474337494838553754495225735403952 |
| 1. Orthography 2. Bibliography |
Copyright © Philip M. Parker, INSEAD. Terms of Use.
